Unidad de medición de la fuente de pulso de alta corriente de 100 V/100 A HCP300 para IGBT

Unidad de la medida de la fuente
February 24, 2025
Video Description:
Discover the HCP300 High Current Pulse Source Measure Unit, designed for IGBT testing with 100V/100A capabilities. Ideal for solar cell modules and RF devices, it offers 0.1% accuracy and a 250k sampling rate. Perfect for high-power device testing and semiconductor performance analysis.
Vídeos relacionados

Analista de parámetros de semiconductores de 1200V/100A SPA6100

Sistemas de ensayo de semiconductores
February 25, 2025

Sistema de ensayo del sensor de corriente de 1000A CTMS

Sistemas de ensayo de semiconductores
February 25, 2025